Method for forming semiconductor device

ABSTRACT

A method for forming a semiconductor device includes steps that provides a lead frame which has a die pad and a plurality of leads extending toward an outside from the die pad, that mounts a semiconductor chip on the die pad, that defines a plurality of inner leads by cutting a predetermined cut portion on the each of the leads locating around the semiconductor chip, and that bonds with a wire between the each of inner leads and the semiconductor chip. Accordingly, the method for forming the semiconductor device can get applicable lead frame for several sizes of a semiconductor chip.

BACKGROUND OF THE INVENTION

[0001] 1. Field of the Invention

[0002] The present invention generally relates to a semiconductor module, and more particularly, the present invention relates to a pattern shape for a contacting portion formed on a printed wiring board.

[0003] This application is a counterpart of Japanese application Serial No. 257637/1999, filed Sep. 10, 1999, the subject matter of which is incorporated herein by reference.

[0004] 20 Description of the Related Art

[0005] In a conventional art, a lead frame is designed a die pad based on a size of a semiconductor chip and designed an inner lead in consideration of a wire length and the number of pins.

[0006] It is desired to get applicable lead frame for several sizes of a semiconductor chip.

SUMMARY OF THE INVENTION

[0007] An object of the present invention is to provide a method for forming a semiconductor device that can get applicable lead frame for several sizes of a semiconductor chip.

[0008] According to one aspect of the present invention, for achieving the above object, there is provided a method for forming a semiconductor device includes steps that provides a lead frame which has a die pad and a plurality of leads extending toward outside from the die pad, that mounts a semiconductor chip on the die pad, that defines a plurality of inner leads by cutting a predetermined cut portion on the each of the leads locating around the semiconductor chip, and that bonds with a wire between the each of inner leads and the semiconductor chip.

BRIEF DESCRIPTION OF THE DRAWINGS

[0009] While the specification concludes with claims particularly pointing out and distinctly claiming the subject matter that is regarded as the invention, the invention, along with the objects, features, and advantages thereof, will be better understood from the following description taken in connection with the accompanying drawings, in which:

[0010]FIG. 1A-FIG. 1D are plane views showing a method for forming a semiconductor device according to a first preferred embodiment of a present invention.

[0011]FIG. 2A-FIG. 2C are a plane view and cross-sectional views showing a method for forming a semiconductor device according to a second preferred embodiment of a present invention.

[0012]FIG. 3 is a plane view showing a method for forming a semiconductor device according to a third preferred embodiment of a present invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0013] A method for forming a semiconductor device according to a first preferred embodiment of the present invention will hereinafter be described in detail with reference to the accompanying drawings.

[0014]FIG. 1A-FIG. 1D are plane views showing a method for forming a semiconductor device according to a first preferred embodiment of a present invention.

[0015] As shown in FIG. 1A, a lead frame 200 is preferably made up of a die pad 20, a plurality of leads 10, and a plurality of support bars 30. The plurality of leads 10 and the plurality of support bars 30 become one with the die pad 20. The plurality of leads 10 and the plurality of support bars 30 extend toward outside from the die pad 20. Therefore, before forming a plurality of inner leads, the plurality of leads 10 have became one with the die pad 20.

[0016] As shown in FIG. 1B, a semiconductor chip 40 is mounted on the die pad 20, so-called a die bonding.

[0017] As shown in FIG. 1C, the lead frame 200 mounting the semiconductor chip 40 is transferred to a stage 50 of a wire bonding apparatus (not shown). Next, the plurality of leads 10 is cut around the semiconductor chip 40 in consideration with a size of the semiconductor chip 40. Therefore, a plurality of inner leads 10 a are formed by cutting a predetermined cut portion on the each of the leads 10 locating around the semiconductor chip 40.

[0018] As shown in FIG. 1D, a plurality of electrodes (not shown) on the semiconductor chip 40 is electrically connected to the respective inner leads 10 a with a respective bonding wires 70.

[0019] As mentioned above, the first preferred embodiment of the present invention form the plurality of inner leads 10 a by cutting the predetermined cut portion on the each of the leads 10 locating around the semiconductor chip 40 after the semiconductor chip 40 is mounted on the die pad 20. Accordingly, the first preferred embodiment of the present invention can get applicable lead frame for several sizes of a semiconductor chip. Further, at the time that the semiconductor chip 40 transferred to a stage 50 of a wire bonding apparatus, the each of the leads 10 does not leave from the die pad 20 yet. Therefore, the respective inner leads 10 a are not formed yet. Accordingly, the first preferred embodiment of the present invention can avoid transformer or dispersion for the inner lead.

[0020]FIG. 2A-FIG. 2C are a plane view and cross-sectional views showing a method for forming a semiconductor device according to a second preferred embodiment of a present invention.

[0021] As shown in FIG. 2A, the plurality of leads 10 is cut around the semiconductor chip 40 in consideration with a size of the semiconductor chip 40. Therefore, a plurality of inner leads 10 a are formed by cutting a predetermined cut portion on the each of the leads 10 locating around the semiconductor chip 40.

[0022] Concretely, the semiconductor chip 40 is mounted on the die pad 20. Next, the lead frame 200 mounting the semiconductor chip 40 is transferred to a stage 50 of a wire bonding apparatus(not shown). In this time, since the semiconductor chip 40 is mounted the semiconductor chip, a predetermined cut portion on the each of the leads 10 is defined. Next, the predetermined cut portion is painted black.

[0023] As shown in FIG. 2B and FIG. 2C, laser so as to react to black is emitted to the predetermined cut portion. As a result, a cut portion is formed.

[0024] As mentioned above, the second preferred embodiment of the present invention can form the plurality of inner leads 10 a in a lump. Accordingly, the second preferred embodiment of the present invention can easily form the plurality of inner leads 10 a without using mechanical cutting.

[0025]FIG. 3 is a plane view showing a method for forming a semiconductor device according to a third preferred embodiment of a present invention.

[0026] As shown in FIG. 3, when cutting the each of the leads 10, the cutting step is performed based on a situation whether or not the each of the leads 10 needs the wire bonding. Accordingly, third preferred embodiment of the present invention can get applicable lead frame for several sizes of the semiconductor chip as compared with first and second preferred embodiments.

[0027] While the present invention has been described with reference to the illustrative embodiments, this description is not intended to be construed in a limiting sense. Various modifications of the illustrative embodiments, as well as other embodiments of the invention, will be apparent to those skilled in the art on reference to this description. It is therefore contemplated that the appended claims will cover any such modifications or embodiments as fall within the true scope of the invention. 

What is claimed is:
 1. A method for forming a semiconductor device comprising: providing a lead frame which has a die pad and a plurality of leads extending toward outside from the die pad; mounting a semiconductor chip on the die pad; defining a plurality of inner leads by cutting a predetermined cut portion on the each of the leads locating around the semiconductor chip; and bonding with a wire between the each of inner leads and the semiconductor chip.
 2. A method for forming a semiconductor device as claimed in claim 1, wherein the cutting step performs by emitting to the predetermined cut portion with a laser.
 3. A method for forming a semiconductor device as claimed in claim 2, wherein the cutting step uses the predetermined cut portion being a black, and it uses the laser so as to react to the black.
 4. A method for forming a semiconductor device as claimed in claim 2, wherein a surface of the predetermined cut portion on the each of the leads has reflectance lower than portion on the each of the leads except for the predetermined cut portion.
 5. A method for forming a semiconductor device as claimed in claim 4, wherein the reflectance decreases by spraying an oxygen.
 6. A method for forming a semiconductor device comprising: providing a lead frame which has a die pad and a plurality of leads extending toward outside from the die pad; mounting a semiconductor chip on the die pad; transferring the semiconductor chip to a stage of a wire bonding apparatus; defining a plurality of inner leads by cutting a predetermined cut portion on the each of the leads locating around the semiconductor chip; and bonding with a wire between the each of inner leads and the semiconductor chip.
 7. A method for forming a semiconductor device as claimed in claim 6, wherein the cutting step performs by emitting to the predetermined cut portion with a laser.
 8. A method for forming a semiconductor device as claimed in claim 7, wherein the cutting step uses the predetermined cut portion being a black, and it uses the laser so as to react to the black.
 9. A method for forming a semiconductor device as claimed in claim 7, wherein a surface of the predetermined cut portion on the each of the leads has reflectance lower than portion on the each of the leads except for the predetermined cut portion.
 10. A method for forming a semiconductor device as claimed in claim 9, wherein the reflectance decreases by spraying an oxygen. 